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    ISQED
    2007
    IEEE
    104views Hardware» more  ISQED 2007»
    A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
    15 years 3 months ago
    A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
    Download  www.isqed.org
    Andrew B. Kahng, Rasit Onur Topaloglu
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    VLSID
    2007
    IEEE
    103views VLSI» more  VLSID 2007»
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    15 years 10 months ago
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    Download  www.eecs.northwestern.edu
    Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
    Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...
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