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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
ICSE
2001
IEEE-ACM
15 years 9 months ago
Designing Concurrent, Distributed, and Real-Time Applications with UML
Object-oriented concepts are crucial in software design because they address fundamental issues of adaptation and evolution. With the proliferation of object-oriented notations an...
Hassan Gomaa
ICIAR
2004
Springer
15 years 10 months ago
Neuro-Fuzzy Method for Automated Defect Detection in Aluminium Castings
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...
Sergio Hernández, Doris Saez, Domingo Mery
ISPASS
2008
IEEE
15 years 11 months ago
Pinpointing and Exploiting Opportunities for Enhancing Data Reuse
—The potential for improving the performance of data-intensive scientific programs by enhancing data reuse in cache is substantial because CPUs are significantly faster than me...
Gabriel Marin, John M. Mellor-Crummey
134
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SIGSOFT
2010
ACM
15 years 2 months ago
Staged concurrent program analysis
Concurrent program verification is challenging because it involves exploring a large number of possible thread interleavings together with complex sequential reasoning. As a resul...
Nishant Sinha, Chao Wang