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» A Family of Logical Fault Models for Reversible Circuits
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DATE
2006
IEEE
88views Hardware» more  DATE 2006»
15 years 5 months ago
Timing-reasoning-based delay fault diagnosis
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diagnosis. In contrast to previous approaches which identify candidates by utilizin...
Kai Yang, Kwang-Ting Cheng
CL
2000
Springer
15 years 4 months ago
Modelling Digital Circuits Problems with Set Constraints
A number of diagnostic and optimisation problems in Electronics Computer Aided Design have usually been handled either by specific tools or by mapping them into a general problem s...
Francisco Azevedo, Pedro Barahona
JUCS
2007
95views more  JUCS 2007»
14 years 11 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow
VTS
2002
IEEE
120views Hardware» more  VTS 2002»
15 years 4 months ago
Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
Madhu K. Iyer, Kwang-Ting Cheng
EVOW
2001
Springer
15 years 4 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...