: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
: Qualitative trend analysis (QTA) is a process-history-based data-driven technique that works by extracting important features (trends) from the measured signals and evaluating th...
Mano Ram Maurya, Praveen K. Paritosh, Raghunathan ...
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...