312 search results - page 34 / 63 » A Formal Measure of Machine Intelligence |
AIME
2009
Springer
15 years 1 months ago
2009
Springer
This paper empirically compares six background correction methods aimed at removing unspecific background noise of the overall signal level measured by a scanner across microarrays...
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
AAAI
1996
14 years 11 months ago
1996
Inductive algorithms rely strongly on their representational biases, Constructive induction can mitigate representational inadequacies. This paper introduces the notion of a relat...
EMNLP
2009
14 years 7 months ago
2009
We present a machine translation framework that can incorporate arbitrary features of both input and output sentences. The core of the approach is a novel decoder based on lattice...
WWW
2006
ACM
15 years 10 months ago
2006
ACM
In most web sites, web-based applications (such as web portals, emarketplaces, search engines), and in the file systems of personal computers, a wide variety of schemas (such as t...