2370 search results - page 429 / 474 » A Framework for the Simulation Experimentation Process |
105
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ET
2007
14 years 11 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
119
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TMI
2010
14 years 6 months ago
2010
Within-subject analysis in fMRI essentially addresses two problems, the detection of brain regions eliciting evoked activity and the estimation of the underlying dynamics. In [1, 2...
BC
2004
14 years 11 months ago
2004
Abstract. This study aims to recover transient, trialvarying evoked potentials (EPs), in particular the movement-related potentials (MRPs), embedded within the background cerebral ...
ICCAD
2003
IEEE
15 years 8 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
103
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SMC
2007
IEEE
15 years 6 months ago
2007
IEEE
—This paper considers the problem of temporally fusing classifier outputs to improve the overall diagnostic classification accuracy in safety-critical systems. Here, we discuss d...