13553 search results - page 2391 / 2711 » A Generalized Multi-View Approach |
155
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
167
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one para...
151
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
ion of Assembler Programs for Symbolic Worst Case Execution Time Analysis Tobias Schuele Tobias.Schuele@informatik.uni-kl.de Klaus Schneider Klaus.Schneider@informatik.uni-kl.de Re...
150
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
134
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...