93 search results - page 5 / 19 » A Genetic Testing Framework for Digital Integrated Circuits |
75
Voted
DATE
2009
IEEE
15 years 1 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
ICCAD
1994
IEEE
15 years 1 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
TCAD
2002
14 years 9 months ago
2002
This paper describes an application of a Constructive Genetic Algorithm (CGA) to the Gate Matrix Layout Problem (GMLP). The GMLP happens in very large scale integration (VLSI) desi...
104
click to vote
GECCO
2006
Springer
15 years 1 months ago
2006
Springer
Embedded Cartesian Genetic Programming (ECGP) is an extension of Cartesian Genetic Programming (CGP) that can automatically acquire, evolve and re-use partial solutions in the for...
115
click to vote
TIFS
2008
14 years 9 months ago
2008
In this paper, we provide a unified framework for identifying the source digital camera from its images and for revealing digitally altered images using photo-response nonuniformit...