845 search results - page 91 / 169 » A Graphical Model for Evolutionary Optimization |
EVOW
2008
Springer
15 years 1 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
101
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EVOW
2006
Springer
15 years 3 months ago
2006
Springer
Abstract. Real-world optimization problems are often subject to uncertainties, which can arise regarding stochastic model parameters, objective functions and decision variables. Th...
102
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IPPS
2006
IEEE
15 years 5 months ago
2006
IEEE
Models of simulation program with integrated circuit emphasis (SPICE) are currently playing a central role in the connection between circuit design and chip fabrication communitie...
181
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AIMDM
1999
Springer
15 years 4 months ago
1999
Springer
Abstract. Images and computer graphics play an increasingly important role in the design and manufacture of medical prostheses and implants. Images provide guidance on optimal desi...
105
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EMNLP
2009
14 years 9 months ago
2009
Virtual evidence (VE), first introduced by (Pearl, 1988), provides a convenient way of incorporating prior knowledge into Bayesian networks. This work generalizes the use of VE to...