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» A Guided Method for Testing Timed Input Output Automata
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CAV
2007
Springer
98views Hardware» more  CAV 2007»
15 years 3 months ago
UPPAAL-Tiga: Time for Playing Games!
In 2005 we proposed the first efficient on-the-fly algorithm for solving games based on timed game automata with respect to reachability and safety properties. The first prototy...
Gerd Behrmann, Agnès Cougnard, Alexandre Da...
KBSE
2010
IEEE
14 years 7 months ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang
AIPS
2000
14 years 10 months ago
Challenges and Methods in Testing the Remote Agent Planner
The Remote Agent Experiment (RAX) on the Deep Space 1 (DS1) mission was the first time that an artificially intelligent agent controlled a NASA spacecraft. One of the key componen...
Benjamin D. Smith, Martin S. Feather, Nicola Musce...
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
15 years 1 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
VLSID
2002
IEEE
78views VLSI» more  VLSID 2002»
15 years 9 months ago
Optimization of Test Accesses with a Combined BIST and External Test Scheme
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
Makoto Sugihara, Hiroto Yasuura