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» A Logical Temporal Relational Data Model
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DAC
2007
ACM
16 years 23 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
PKDD
2009
Springer
149views Data Mining» more  PKDD 2009»
15 years 6 months ago
Learning to Disambiguate Search Queries from Short Sessions
Web searches tend to be short and ambiguous. It is therefore not surprising that Web query disambiguation is an actively researched topic. To provide a personalized experience for ...
Lilyana Mihalkova, Raymond J. Mooney
107
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ECCV
2004
Springer
16 years 1 months ago
Novel Skeletal Representation for Articulated Creatures
Abstract. Volumetric structures are frequently used as shape descriptors for 3D data. The capture of such data is being facilitated by developments in multi-view video and range sc...
Gabriel J. Brostow, Irfan A. Essa, Drew Steedly, V...
CAISE
2005
Springer
15 years 5 months ago
BInXS: A Process for Integration of XML Schemata
This paper presents a detailed integration process for XML schemata called BInXS. BInXS adopts a global-as-view integration approach that builds a global schema from a set of heter...
Ronaldo dos Santos Mello, Carlos A. Heuser
SEMWEB
2009
Springer
15 years 6 months ago
Ontologies for User Interface Integration
There are different strategies to integrate software systems: integration on the data layer, on the business logic layer, and on the user interface layer. The latter area, recent...
Heiko Paulheim