Sciweavers

1178 search results - page 154 / 236
» A Methodological Approach to Developing Model Transformation...
Sort
View
97
Voted
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
15 years 7 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
ICIP
2008
IEEE
15 years 8 months ago
Using region semantics and visual context for scene classification
In this paper we focus on scene classification and detection of high-level concepts within multimedia documents, by introducing an intermediate contextual approach as a means of ...
Evaggelos Spyrou, Phivos Mylonas, Yannis S. Avrith...
133
Voted
FDL
2007
IEEE
15 years 8 months ago
Measuring the Quality of a SystemC Testbench by using Code Coverage Techniques
The system description language SystemC enables to quickly create executable specifications at adequate levbstraction for both hardware/software integration and fast design space...
Daniel Große, Hernan Peraza, Wolfgang Klinga...
ECBS
1999
IEEE
171views Hardware» more  ECBS 1999»
15 years 6 months ago
Metamodeling - Rapid Design and Evolution of Domain-Specific Modeling Environments
Model integrated computing (MIC) is gaining increased attention as an effective and efficient method for developing, maintaining, and evolving large-scale, domain-specific softwar...
Greg Nordstrom, Janos Sztipanovits, Gabor Karsai, ...
BMCBI
2008
77views more  BMCBI 2008»
15 years 2 months ago
Stochastic models for the in silico simulation of synaptic processes
Background: Research in life sciences is benefiting from a large availability of formal description techniques and analysis methodologies. These allow both the phenomena investiga...
Andrea Bracciali, Marcello Brunelli, Enrico Catald...