465 search results - page 23 / 93 » A New Approach for Low Power Scan Testing |
188
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BMCBI
2011
14 years 11 months ago
2011
Background: In the last decades, microarray technology has spread, leading to a dramatic increase of publicly available datasets. The first statistical tools developed were focuse...
167
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SCIA
2009
Springer
15 years 10 months ago
2009
Springer
Many computer vision problems can be formulated as low rank bilinear minimization problems. One reason for the success of these problems is that they can be efficiently solved usin...
139
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IWCMC
2006
ACM
15 years 10 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
115
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ITC
1991
IEEE
15 years 7 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
116
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ICCAD
1996
IEEE
15 years 8 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...