465 search results - page 26 / 93 » A New Approach for Low Power Scan Testing |
118
Voted
DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
125
Voted
MTDT
2000
IEEE
15 years 8 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
123
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
136
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KDD
2005
ACM
16 years 4 months ago
2005
ACM
We propose a new class of spatio-temporal cluster detection methods designed for the rapid detection of emerging space-time clusters. We focus on the motivating application of pro...
148
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DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
15 years 5 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...