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» A New Approach for Low Power Scan Testing
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164
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ASPDAC
1995
ACM
104views Hardware» more  ASPDAC 1995»
15 years 9 months ago
Power analysis of a 32-bit embedded microcontroller
A new approach for power analysis of microprocessorshas recently been proposed [1]. The idea is to look at the power consumption in a microprocessor from the point of view of the ...
Vivek Tiwari, Mike Tien-Chien Lee
182
Voted
DAGM
2009
Springer
16 years 20 days ago
Multi-view Object Detection Based on Spatial Consistency in a Low Dimensional Space
This paper describes a new approach for detecting objects based on measuring the spatial consistency between different parts of an object. These parts are pre-defined on a set of...
Gurman Gill, Martin Levine
AI
2006
Springer
15 years 9 months ago
A New Profile Alignment Method for Clustering Gene Expression Data
We focus on clustering gene expression temporal profiles, and propose a novel, simple algorithm that is powerful enough to find an efficient distribution of genes over clusters. We...
Ataul Bari, Luis Rueda
CSDA
2011
15 years 1 months ago
An affine invariant multiple test procedure for assessing multivariate normality
: A multiple test procedure for assessing multivariate normality (MVN) that combines a finite set of affine invariant test statistics for MVN is proposed. This combination is base...
Carlos Tenreiro
ICMCS
2006
IEEE
148views Multimedia» more  ICMCS 2006»
16 years 4 days ago
A Handover Approach to DVB-H Services
DVB-H offers a new platform for IP-based services and contributes to universal access. There are many challenges of providing multimedia TV experience for DVB-H users anywhere any...
Ville Ollikainen, Chengyuan Peng