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» A New Approach for Low Power Scan Testing
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ASPDAC
1995
ACM
104views Hardware» more  ASPDAC 1995»
15 years 7 months ago
Power analysis of a 32-bit embedded microcontroller
A new approach for power analysis of microprocessorshas recently been proposed [1]. The idea is to look at the power consumption in a microprocessor from the point of view of the ...
Vivek Tiwari, Mike Tien-Chien Lee
154
Voted
DAGM
2009
Springer
15 years 10 months ago
Multi-view Object Detection Based on Spatial Consistency in a Low Dimensional Space
This paper describes a new approach for detecting objects based on measuring the spatial consistency between different parts of an object. These parts are pre-defined on a set of...
Gurman Gill, Martin Levine
AI
2006
Springer
15 years 7 months ago
A New Profile Alignment Method for Clustering Gene Expression Data
We focus on clustering gene expression temporal profiles, and propose a novel, simple algorithm that is powerful enough to find an efficient distribution of genes over clusters. We...
Ataul Bari, Luis Rueda
CSDA
2011
14 years 11 months ago
An affine invariant multiple test procedure for assessing multivariate normality
: A multiple test procedure for assessing multivariate normality (MVN) that combines a finite set of affine invariant test statistics for MVN is proposed. This combination is base...
Carlos Tenreiro
147
Voted
ICMCS
2006
IEEE
148views Multimedia» more  ICMCS 2006»
15 years 10 months ago
A Handover Approach to DVB-H Services
DVB-H offers a new platform for IP-based services and contributes to universal access. There are many challenges of providing multimedia TV experience for DVB-H users anywhere any...
Ville Ollikainen, Chengyuan Peng