465 search results - page 33 / 93 » A New Approach for Low Power Scan Testing |
152
click to vote
VLSID
2006
IEEE
15 years 10 months ago
2006
IEEE
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
113
click to vote
DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Power distribution and signal transmission are becoming key limiters for chip performance in nanometer era. These issues can be simultaneously addressed by designing transmission ...
136
click to vote
ICDAR
2003
IEEE
15 years 9 months ago
2003
IEEE
In this paper, we present a new approach to extracting the target text line from a document image captured by a pen scanner. Given the binary image, a set of possible text lines a...
121
click to vote
SDM
2009
SIAM
16 years 1 months ago
2009
SIAM
Most pattern discovery algorithms easily generate very large numbers of patterns, making the results impossible to understand and hard to use. Recently, the problem of instead sel...
123
click to vote
GLVLSI
2003
IEEE
15 years 9 months ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...