465 search results - page 4 / 93 » A New Approach for Low Power Scan Testing |
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
CLEF
2010
Springer
14 years 10 months ago
2010
Springer
We propose to use MapReduce to quickly test new retrieval approaches on a cluster of machines by sequentially scanning all documents. We present a small case study in which we use ...
85
Voted
ATS
2004
IEEE
15 years 1 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
DFT
2004
IEEE
15 years 1 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
70
Voted
MTV
2007
IEEE
15 years 3 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...