465 search results - page 5 / 93 » A New Approach for Low Power Scan Testing |
ISLPED
2005
ACM
15 years 3 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
ISBI
2011
IEEE
14 years 1 months ago
2011
IEEE
Most algorithms used for imaging genetics examine statistical effects of each individual genetic variant, one at a time. We developed a new approach, based on ridge regression, to...
IOLTS
2008
IEEE
15 years 3 months ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
72
Voted
ISQED
2010
IEEE
15 years 2 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...