465 search results - page 66 / 93 » A New Approach for Low Power Scan Testing |
164
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GLVLSI
2006
IEEE
15 years 10 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
121
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FPGA
2003
ACM
15 years 9 months ago
2003
ACM
This paper proposes a new high-level technique for designing fault tolerant systems in SRAM-based FPGAs, without modifications in the FPGA architecture. Traditionally, TMR has bee...
164
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AES
2005
Springer
15 years 3 months ago
2005
Springer
Media-processing applications, such as signal processing, 2D and 3D graphics rendering, and image compression, are the dominant workloads in many embedded systems today. The real-...
166
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BMCBI
2010
15 years 4 months ago
2010
Background: It is well known that most of the binding free energy of protein interaction is contributed by a few key hot spot residues. These residues are crucial for understandin...
141
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BMCBI
2005
15 years 3 months ago
2005
Background: Understanding transcriptional regulation of gene expression is one of the greatest challenges of modern molecular biology. A central role in this mechanism is played b...