465 search results - page 67 / 93 » A New Approach for Low Power Scan Testing |
126
Voted
DAC
2006
ACM
16 years 4 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
162
Voted
ICCV
2003
IEEE
16 years 5 months ago
2003
IEEE
Previous works have demonstrated that the face recognition performance can be improved significantly in low dimensional linear subspaces. Conventionally, principal component analy...
108
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DATE
2000
IEEE
15 years 8 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
122
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ECCV
1996
Springer
16 years 5 months ago
1996
Springer
An approach is presented for imposing generic hard constraints on deformable models at a low computational cost, while preserving the good convergence properties of snake-like mod...
106
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CCIA
2009
Springer
15 years 5 months ago
2009
Springer
Abstract. The design and the validation of an automatic plaque characterization technique based on Intravascular Ultrasound (IVUS) usually requires a data ground-truth. The histolo...