465 search results - page 68 / 93 » A New Approach for Low Power Scan Testing |
155
Voted
WCNC
2008
IEEE
15 years 10 months ago
2008
IEEE
—1 In ISM bands, many wireless protocols proliferate such as 802.11, Bluetooth, and ZigBee. However, these incompatible protocols create complex coexistence and connectivity prob...
128
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CIDM
2007
IEEE
15 years 4 months ago
2007
IEEE
— Detecting unknown worms is a challenging task. Extant solutions, such as anti-virus tools, rely mainly on prior explicit knowledge of specific worm signatures. As a result, aft...
142
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ISCA
2009
IEEE
15 years 10 months ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
124
Voted
GECCO
2004
Springer
15 years 9 months ago
2004
Springer
When applied to real-world problems, the powerful optimization tool of Evolutionary Algorithms frequently turns out to be too time-consuming due to elaborate fitness calculations t...
141
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TDSC
2010
15 years 2 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...