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» A New Approach to Component Testing
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117
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DATE
1998
IEEE
92views Hardware» more  DATE 1998»
15 years 8 months ago
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis...
100
Voted
SIGDOC
2000
ACM
15 years 8 months ago
Testing documentation with "low-tech" simulation
∗ This paper introduces low-tech simulation as a technique for testing procedures and their documentation. The key idea is to test the interface-procedure-documentation set in th...
David G. Novick
159
Voted
GI
2009
Springer
15 years 1 months ago
Automated GUI Testing Validation guided by Annotated Use Cases
Abstract: This paper presents a new approach to Automatic GUI Test Case Generation and Validation: a use case-guided technique to reduce the effort required in GUI modeling and tes...
Pedro Luis Mateo Navarro, Diego Sevilla Ruiz, Greg...
108
Voted
IPMI
2003
Springer
16 years 4 months ago
Permutation Tests for Classification: Towards Statistical Significance in Image-Based Studies
Abstract. Estimating statistical significance of detected differences between two groups of medical scans is a challenging problem due to the high dimensionality of the data and th...
Polina Golland, Bruce Fischl
143
Voted
CAEPIA
2011
Springer
14 years 3 months ago
Evaluating a Reinforcement Learning Algorithm with a General Intelligence Test
In this paper we apply the recent notion of anytime universal intelligence tests to the evaluation of a popular reinforcement learning algorithm, Q-learning. We show that a general...
Javier Insa-Cabrera, David L. Dowe, José He...