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DATE
1998
IEEE
15 years 2 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
95
Voted
GECCO
2006
Springer
15 years 1 months ago
2006
Springer
Encapsulation of states in object-oriented programs hinders the search for test data using evolutionary testing. As client code is oblivious to the internal state of a server obje...
COMPSAC
2006
IEEE
15 years 4 months ago
2006
IEEE
Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible. The sizes of test suites grow as software evolv...
DAC
1994
ACM
15 years 2 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...