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73
Voted
VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
ISQED
2006
IEEE
15 years 4 months ago
2006
IEEE
As transistor counts keep increasing and clock frequencies rise, high power consumption is becoming one of the most important obstacles, preventing further scaling and performance...
PRL
2006
14 years 10 months ago
2006
This paper proposes a new evolutionary region merging method in order to efficiently improve segmentation quality results. Our approach starts from an oversegmented image, which is...
95
Voted
EURODAC
1995
IEEE
15 years 1 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
91
Voted
ICASSP
2011
IEEE
14 years 1 months ago
2011
IEEE
This paper presents a new algorithm based on shift-invariant probabilistic latent component analysis that analyzes harmonic structures in an audio signal. Each note in a constant-...