3481 search results - page 165 / 697 » A New Approach to Component Testing |
117
Voted
SIGIR
2004
ACM
15 years 9 months ago
2004
ACM
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...
148
Voted
BIOINFORMATICS
2007
15 years 3 months ago
2007
Motivation: Protein–protein complexes are known to play key roles in many cellular processes. However, they are often not accessible to experimental study because of their low s...
153
Voted
ASPDAC
2010
ACM
15 years 1 months ago
2010
ACM
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
121
Voted
FOSSACS
2010
Springer
15 years 10 months ago
2010
Springer
Abstract. This paper considers the probabilistic may/must testing theory for processes having external, internal, and probabilistic choices. We observe that the underlying testing ...
120
Voted
DDECS
2007
IEEE
15 years 10 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...