3481 search results - page 81 / 697 » A New Approach to Component Testing |
ER
2006
Springer
15 years 1 months ago
2006
Springer
Though new technological trends and paradigms arise for developing complex software systems, systematic reuse continues to be an elusive goal. In this context, the adoption of Comm...
DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
VLDB
2002
ACM
14 years 9 months ago
2002
ACM
Data warehouses offer a compromise between freshness of data and query evaluation times. However, a fixed preference ratio between these two variables is too undifferentiated. Wit...
IWANN
2005
Springer
15 years 3 months ago
2005
Springer
Abstract. The authors propose a new solution to the blind robust watermarking of digital images. In this approach we embed the watermark into the independent components of the imag...
CBSE
2004
Springer
15 years 3 months ago
2004
Springer
Abstract. Current peer-to-peer architectures are hardly resistant against unanticipated exceptions such as the failure of single peers. This can be justified by the absence of soph...