371 search results - page 10 / 75 » A New Method for Interoperability Test Generation |
84
Voted
DDECS
2007
IEEE
15 years 6 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
112
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ITSSA
2006
14 years 11 months ago
2006
: This article proposes a new method for creating test software for object-oriented systems using a genetic programming approach. It is believed that this approach is advantageous ...
DAC
2007
ACM
16 years 19 days ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
TAP
2008
Springer
14 years 11 months ago
2008
Springer
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
115
Voted
PKC
2001
Springer
15 years 4 months ago
2001
Springer
Abstract. We describe a new general method to perform part of the setup stage of the XTR system introduced at Crypto 2000, namely finding the trace of a generator of the XTR group...