371 search results - page 11 / 75 » A New Method for Interoperability Test Generation |
ICCS
2007
Springer
15 years 5 months ago
2007
Springer
Abstract. Multiphysics and multiscale simulation systems are emerging as a new grand challenge in computational science, largely because of increased computing power provided by th...
104
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VLSID
2001
IEEE
16 years 1 days ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
113
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APSEC
2004
IEEE
15 years 3 months ago
2004
IEEE
Unit testing is a methodology for testing small parts of an application independently of whatever application uses them. It is time consuming and tedious to write unit tests, and ...
HVEI
2010
15 years 1 months ago
2010
An objective quality estimator for either still images or video should accurately estimate the perceived quality scores of a collection of stimuli. New applications and processing...
110
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ITC
1996
IEEE
15 years 3 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...