371 search results - page 15 / 75 » A New Method for Interoperability Test Generation |
EDM
2009
14 years 9 months ago
2009
This paper describes a novel method to create a quantitative model of an educational content domain of related practice item-types using learning curves. By using a pairwise test t...
102
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DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
113
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AADEBUG
2005
Springer
15 years 1 months ago
2005
Springer
In a C compiler, function calls are difficult to implement correctly because they must respect a platform-specific calling convention. But they are governed by a simple invariant...
ICCD
2006
IEEE
15 years 8 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
102
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DFT
2003
IEEE
15 years 5 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...