371 search results - page 21 / 75 » A New Method for Interoperability Test Generation |
108
Voted
VTS
2000
IEEE
15 years 6 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
113
Voted
FASE
2007
Springer
15 years 8 months ago
2007
Springer
Although unit tests are recognized as an important tool in software development, programmers prefer to write code, rather than unit tests. Despite the emergence of tools like JUni...
130
click to vote
VTS
2008
IEEE
15 years 8 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
117
Voted
ASPDAC
2004
ACM
15 years 7 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
125
click to vote
IICAI
2003
15 years 3 months ago
2003
Abstract. We present the Acyclic Bayesian Net Generator, a new approach to learn the structure of a Bayesian network using genetic algorithms. Due to the encoding mechanism, acycli...