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» A New Method for Interoperability Test Generation
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BMCBI
2010
108views more  BMCBI 2010»
14 years 8 months ago
Preferred analysis methods for Affymetrix GeneChips. II. An expanded, balanced, wholly-defined spike-in dataset
Background: Concomitant with the rise in the popularity of DNA microarrays has been a surge of proposed methods for the analysis of microarray data. Fully controlled "spike-i...
Qianqian Zhu, Jeffrey C. Miecznikowski, Marc S. Ha...
ATS
2009
IEEE
111views Hardware» more  ATS 2009»
15 years 8 months ago
Dynamic Compaction in SAT-Based ATPG
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
Alejandro Czutro, Ilia Polian, Piet Engelke, Sudha...
DSD
2005
IEEE
105views Hardware» more  DSD 2005»
15 years 7 months ago
Improved Fault Emulation for Synchronous Sequential Circuits
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
Jaan Raik, Peeter Ellervee, Valentin Tihhomirov, R...
96
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JDWM
2007
107views more  JDWM 2007»
15 years 1 months ago
Evolutionary Induction of Mixed Decision Trees
This article presents a new evolutionary algorithm (EA) for induction of mixed decision trees. In nonterminal nodes of a mixed tree, different types of tests can be placed, rangin...
Marek Kretowski, Marek Grzes
99
Voted
ISOLA
2004
Springer
15 years 7 months ago
Case Studies with Lurette V2
Abstract. Lurette is an automated testing tool dedicated to reactive programs. The test process is automated at two levels: given a formal description of the System Under Test (SUT...
Erwan Jahier, Pascal Raymond, Philippe Baufreton