371 search results - page 36 / 75 » A New Method for Interoperability Test Generation |
127
Voted
ATS
1997
IEEE
15 years 8 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
121
Voted
3DPVT
2004
IEEE
15 years 7 months ago
2004
IEEE
We present a novel range sensing method that is capable of constructing accurate 3D models of specular objects. Our method utilizes a new range imaging concept called multi-peak r...
113
click to vote
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
144
click to vote
ICPR
2008
IEEE
15 years 10 months ago
2008
IEEE
In this paper, we present a new tone mapping algorithm for the display of high dynamic range images, inspired by adaptive process of the human visual system. The proposed algorith...
121
Voted
DATE
2000
IEEE
15 years 8 months ago
2000
IEEE
This paper presents a method for redundancy identification (RID) using multi-node logic implications. The algorithm discovers a large number of direct and indirect implications b...