371 search results - page 38 / 75 » A New Method for Interoperability Test Generation |
SAC
2005
ACM
15 years 7 months ago
2005
ACM
This paper addresses single and multiple container loading problems. We propose to use dynamic prioritization to handle awkward box types. The box type with a higher priority will...
109
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TCAD
2002
15 years 1 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
105
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DAC
1995
ACM
15 years 5 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
101
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PODS
2006
ACM
16 years 2 months ago
2006
ACM
Data exchange deals with inserting data from one database into another database having a different schema. We study and solve a central computational problem of data exchange, nam...
114
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SCAM
2006
IEEE
15 years 8 months ago
2006
IEEE
Call graphs are widely used to represent calling relationships among methods. However, there is not much interest in calling relationships among library methods in many software e...