677 search results - page 15 / 136 » A New Start-Up Demonstration Test |
112
Voted
ATS
1998
IEEE
15 years 1 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
102
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ISBI
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper describes a new methodology and associated theoretical analysis for rapid and accurate extraction of activation regions from functional MRI data. Most fMRI data analysi...
79
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ASPDAC
2004
ACM
15 years 2 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
DFT
2003
IEEE
15 years 2 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
FTCS
1993
14 years 10 months ago
1993
We present a new test response compression method called cumulative balance testing (CBT)that extends both balance testing and accumulatorcompression testing. CBT uses an accumulat...