677 search results - page 16 / 136 » A New Start-Up Demonstration Test |
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
84
Voted
SIGSOFT
2006
ACM
15 years 3 months ago
2006
ACM
Developers of distributed systems routinely construct discrete-event simulations to help understand and evaluate the behavior of inter-component protocols. Simulations are abstrac...
AINA
2010
IEEE
15 years 2 months ago
2010
IEEE
—In this paper we present a new cross-platform approach for video game delivery in wired and wireless local networks. The developed 3D streaming and video streaming approaches en...
SIGSOFT
2007
ACM
15 years 10 months ago
2007
ACM
Software testing is extensively used for uncovering bugs in large, complex software. Testing relies on well designed regression test suites that anticipate all reasonable software...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...