62 search results - page 10 / 13 » A Practical Architecture for Reliable Quantum Computers |
VLSID
2008
IEEE
16 years 20 hour ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
109
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DAC
2007
ACM
16 years 19 days ago
2007
ACM
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
DAC
2003
ACM
16 years 18 days ago
2003
ACM
With the scaling of technology, power grid noise is becoming increasingly significant for circuit performance. A typical power grid circuit contains millions of linear elements, m...
HPDC
2010
IEEE
15 years 22 days ago
2010
IEEE
Today, the BitTorrent Peer-to-Peer file-sharing network is one of the largest Internet applications--it generates massive traffic volumes, it is deployed in thousands of independe...
101
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TC
2011
14 years 6 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...