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VLSID
2007
IEEE
130views VLSI» more  VLSID 2007»
15 years 10 months ago
Impact of NBTI on FPGAs
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
Krishnan Ramakrishnan, S. Suresh, Narayanan Vijayk...
ICSE
2005
IEEE-ACM
15 years 9 months ago
Helping users avoid bugs in GUI applications
In this paper, we propose a method to help users avoid bugs in GUI applications. In particular, users would use the application normally and report bugs that they encounter to pre...
Amir Michail, Tao Xie
58
Voted
CHI
2009
ACM
15 years 4 months ago
'Broken Expectations' from a global business perspective
Especially in the past few years, there has been an increase in the rejection rate of interactive consumer electronics products in the field, not due to broken hardware or softwar...
Aylin Koca, Evangelos Karapanos, Aarnout Brombache...
GECCO
2009
Springer
156views Optimization» more  GECCO 2009»
15 years 4 months ago
Insight knowledge in search based software testing
Software testing can be re-formulated as a search problem, hence search algorithms (e.g., Genetic Algorithms) can be used to tackle it. Most of the research so far has been of emp...
Andrea Arcuri
FGR
2008
IEEE
184views Biometrics» more  FGR 2008»
15 years 4 months ago
Multi-attribute robust facial feature localization
In this paper, we focus on the reliable detection of facial fiducial points, such as eye, eyebrow and mouth corners. The proposed algorithm aims to improve automatic landmarking ...
Oya Çeliktutan, Hatice Cinar Akakin, Bü...