29 search results - page 3 / 6 » A Real Case of Significant Scan Test Cost Reduction |
VLDB
2000
ACM
13 years 10 months ago
2000
ACM
Many emerging application domains require database systems to support efficient access over highly multidimensional datasets. The current state-of-the-art technique to indexing hi...
HICSS
2005
IEEE
13 years 12 months ago
2005
IEEE
A continuous technological innovation in software has brought development in integration technologies that promise the real time enterprise-wide systems integration. Healthcare or...
ICST
2009
IEEE
13 years 4 months ago
2009
IEEE
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows to skip the signature prediction phase of conventional transparent BIST approaches...
GECCO
2006
Springer
13 years 10 months ago
2006
Springer
A new model for the One-dimensional Cutting Stock problem using Genetic Algorithms (GA) is developed to optimize construction steel bars waste. One-dimensional construction stocks...