980 search results - page 13 / 196 » A Sequential Reduction Strategy |
MTV
2007
IEEE
15 years 3 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
FEGC
2009
14 years 7 months ago
2009
We develop an efficient algorithm for detecting frequent patterns that occur in sequence databases under certain constraints. By combining the use of bit vector representations of ...
KDD
2002
ACM
15 years 10 months ago
2002
ACM
We introduce a new algorithm for mining sequential patterns. Our algorithm is especially efficient when the sequential patterns in the database are very long. We introduce a novel...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
60
Voted
ATAL
2006
Springer
15 years 1 months ago
2006
Springer
This paper describes simulations designed to test the relative efficiency of two different sequential auction mechanisms for allocating compute resources between users in a shared...