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» A Simple Coverage-Based Locator for Multiple Faults
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ICST
2009
IEEE
13 years 9 months ago
A Simple Coverage-Based Locator for Multiple Faults
Fault localization helps spotting faults in source code by exploiting automatically collected data. Deviating from other fault locators relying on hit spectra or test coverage inf...
Friedrich Steimann, Mario Bertschler
ITC
2003
IEEE
162views Hardware» more  ITC 2003»
13 years 7 months ago
FPGA Interconnect Delay Fault Testing
The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable manufacturing test method for all SRAM-based FPGAs, able to detect multiple inter...
Erik Chmelar
SRDS
1993
IEEE
13 years 6 months ago
Bayesian Analysis for Fault Location in Homogeneous Distributed Systems
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
Yu Lo Cyrus Chang, Leslie C. Lander, Horng-Shing L...
DATE
2002
IEEE
79views Hardware» more  DATE 2002»
13 years 7 months ago
Incremental Diagnosis and Correction of Multiple Faults and Errors
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified a...
Andreas G. Veneris, Jiang Brandon Liu, Mandana Ami...
DCC
2005
IEEE
14 years 2 months ago
Elliptic Curve Cryptosystems in the Presence of Permanent and Transient Faults
Elliptic curve cryptosystems in the presence of faults were studied by Biehl, Meyer and M?uller (2000). The first fault model they consider requires that the input point P in the c...
Mathieu Ciet, Marc Joye