3707 search results - page 52 / 742 » A Simple Technique for Self-Calibration |
ITC
2000
IEEE
15 years 2 months ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
IPPS
1998
IEEE
15 years 2 months ago
1998
IEEE
Abstract. Finding paths in high-dimensional gemetric spaces is a provably hard problem. Recently, a general randomized planning scheme has emerged as an e ective approach to solve ...
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SC
1993
ACM
15 years 1 months ago
1993
ACM
In this paper, we describe two new ideas by which HPF compiler can deal with irregular computations e ectively. The rst mechanism invokes a user speci ed mapping procedure via a s...
DAC
1994
ACM
15 years 1 months ago
1994
ACM
-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...
EUC
2008
Springer
14 years 11 months ago
2008
Springer
Static path analysis is a key process of Worst Case Execution Time (WCET) estimation, the objective of which is to find the execution path that has the largest execution time. Cur...