—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Multiple, highly autonomous, satellite systems are envisioned in the near future because they are capable of higher performance, lower cost, better fault tolerance, reconfigurabil...
Thomas P. Schetter, Mark E. Campbell, Derek M. Sur...
The paper provides an overview of the agent-based solutions developed by the Rockwell Automation company for the purposes of industrial control. Using agent-based manufacturing co...
Thoracic electrical impedance tomography (EIT) is a noninvasive, radiation-free monitoring technique whose aim is to reconstruct a cross-sectional image of the internal spatial dis...