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DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SIGSOFT
2008
ACM
15 years 10 months ago
Marple: a demand-driven path-sensitive buffer overflow detector
Despite increasing efforts in detecting and managing software security vulnerabilities, the number of security attacks is still rising every year. As software becomes more complex...
Wei Le, Mary Lou Soffa
SIGSOFT
2005
ACM
15 years 10 months ago
Matching execution histories of program versions
We develop a method for matching dynamic histories of program executions of two program versions. The matches produced can be useful in many applications including software piracy...
Xiangyu Zhang, Rajiv Gupta
WWW
2003
ACM
15 years 10 months ago
On deep annotation
The success of the Semantic Web crucially depends on the easy creation, integration and use of semantic data. For this purpose, we consider an integration scenario that defies cor...
Siegfried Handschuh, Steffen Staab, Raphael Volz
PPOPP
2009
ACM
15 years 10 months ago
A compiler-directed data prefetching scheme for chip multiprocessors
Data prefetching has been widely used in the past as a technique for hiding memory access latencies. However, data prefetching in multi-threaded applications running on chip multi...
Dhruva Chakrabarti, Mahmut T. Kandemir, Mustafa Ka...