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» A Statistical Approach to the Processing of Metonymy
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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
15 years 4 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
KDD
1997
ACM
128views Data Mining» more  KDD 1997»
15 years 1 months ago
An Interactive Visualization Environment for Data Exploration
Exploratory data analysis is a process of sifting through data in search of interesting information or patterns. Analysts’ current tools for exploring data include database mana...
Mark Derthick, John Kolojejchick, Steven F. Roth
BMCBI
2008
92views more  BMCBI 2008»
14 years 9 months ago
A semiparametric modeling framework for potential biomarker discovery and the development of metabonomic profiles
Background: The discovery of biomarkers is an important step towards the development of criteria for early diagnosis of disease status. Recently electrospray ionization (ESI) and ...
Samiran Ghosh, David F. Grant, Dipak K. Dey, Denni...
BMCBI
2008
88views more  BMCBI 2008»
14 years 9 months ago
Microarray-based gene set analysis: a comparison of current methods
Background: The analysis of gene sets has become a popular topic in recent times, with researchers attempting to improve the interpretability and reproducibility of their microarr...
Sarah Song, Michael A. Black
COMBINATORICA
2007
129views more  COMBINATORICA 2007»
14 years 9 months ago
Birth control for giants
The standard Erd˝os-Renyi model of random graphs begins with n isolated vertices, and at each round a random edge is added. Parametrizing n 2 rounds as one time unit, a phase tra...
Joel H. Spencer, Nicholas C. Wormald