340 search results - page 12 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
ICCAD
2002
IEEE
15 years 8 months ago
2002
IEEE
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
ICCD
2005
IEEE
15 years 8 months ago
2005
IEEE
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for VLSI design. This paper,...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
DATE
2005
IEEE
15 years 5 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
JILP
2002
14 years 11 months ago
2002
As microprocessor designs continue to evolve, many optimizations reach a point of diminishing returns. We introduce HLS, a hybrid processor simulator which uses statistical models...