340 search results - page 23 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
109
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DAC
2003
ACM
16 years 22 days ago
2003
ACM
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
102
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CODES
2008
IEEE
14 years 12 months ago
2008
IEEE
With power becoming a major constraint for multi-processor embedded systems, it is becoming important for designers to characterize and model processor power dissipation. It is cr...
75
Voted
DAC
2000
ACM
15 years 4 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
95
Voted
DAC
2005
ACM
16 years 22 days ago
2005
ACM
In this work, we propose a new paradigm called power emulation, which exploits hardware acceleration to drastically speedup power estimation. Power emulation is based on the obser...
VLSID
1993
IEEE
15 years 3 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...