340 search results - page 26 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
GLVLSI
2009
IEEE
15 years 3 months ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
DAC
2003
ACM
16 years 22 days ago
2003
ACM
The use of Support Vector Machines (SVMs) to represent the performance space of analog circuits is explored. In abstract terms, an analog circuit maps a set of input design parame...
DFT
2005
IEEE
15 years 5 months ago
2005
IEEE
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
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ISCAS
2006
IEEE
15 years 5 months ago
2006
IEEE
— This paper presents some circuitry for use within a visual-processing depth-recovery algorithm based upon spike timing. The accuracy of the depth calculation relies on a predic...