340 search results - page 28 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
DAC
2005
ACM
15 years 1 months ago
2005
ACM
Traditional corner analysis fails to guarantee a target yield for a given performance metric. However, recently proposed solutions, in the form of statistical timing analysis, whi...
ICCAD
2004
IEEE
15 years 8 months ago
2004
IEEE
While process variations are becoming more significant with each new IC technology generation, they are often modeled via linear regression models so that the resulting performanc...
ISLPED
2006
ACM
15 years 5 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DAC
2006
ACM
16 years 23 days ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
GLVLSI
2006
IEEE
15 years 5 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...