340 search results - page 37 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
DAC
2007
ACM
16 years 24 days ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
GLVLSI
2007
IEEE
15 years 6 months ago
2007
IEEE
This paper proposes a library-free technology mapping algorithm to reduce delay in combinational circuits. The algorithm reduces the overall number of series transistors through t...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Sleep transistor insertion is one of today’s most promising and widely adopted solutions for controlling stand-by leakage power in nanometer circuits. Although single-cycle powe...
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VLSID
2005
IEEE
16 years 5 days ago
2005
IEEE
Abstract--Power analysis early in the design cycle is critical for the design of lowpower systems. With the move to system-level specifications and design methodologies, there has ...
GLVLSI
2010
IEEE
15 years 4 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...