340 search results - page 39 / 68 » A Statistical Performance Simulation Methodology for VLSI Ci... |
DAC
2003
ACM
16 years 23 days ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
GLVLSI
2005
IEEE
15 years 5 months ago
2005
IEEE
This paper presents a fully integrated 1-V, dual band, fastlocked frequency synthesizer for IEEE 802.11 a/b/g WLAN applications. It can synthesize frequencies in the range of 2.4 ...
ICCD
2008
IEEE
15 years 8 months ago
2008
IEEE
— Increasing sizes of benchmarks make detailed simulation an extremely time consuming process. Statistical techniques such as the SimPoint methodology have been proposed in order...
DFT
2004
IEEE
15 years 3 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
ICCAD
2001
IEEE
15 years 8 months ago
2001
IEEE
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...